Scanning Electron Microcopy (SEM) has developed into a critical tool within numerous different research fields, spanning everything from materials science to forensics to industrial manufacturing. As soon as microscopic information about the surface or near-surface region of a specimen is needed, SEM becomes a necessary tool by allowing more of a specimen to be in focus at one time. For that reason, the method finds applications in nearly every branch of science, technology, and industry.
This learning center was created to connect researchers around the world with the latest information on scanning electron microscopy (SEM). Our comprehensive learning center will help users answer questions about our comprehensive portfolio of floor-model and desktop SEMs by answering questions about and proving usable data by combining high-resolution imaging and analysis across scales and modes. The content you will find contains rich and reliable information designed for new and experienced researchers who are exploring the capabilities of SEM. Via the learning center you will be able to learn about SEM at your own pace. Our technical experts are here to support you every step of the way.
Since the introduction of electron microscopes in the 1930s, scanning electron microscopy (SEM) has developed into a critical tool within numerous different research fields, spanning everything from materials science to forensics to industrial manufacturing. As soon as microscopic information about the surface or near-surface region of a specimen is needed, SEM becomes a necessary tool. For that reason, the method finds applications in nearly every branch of science, technology, and industry.
Desktop SEM instruments boast enhanced ease of use, democratizing SEM technology. Additionally, they have the added benefit of a reduced frame size. While traditional “floor model” SEM instrumentation can require a specialized room or facility, desktop instrumentation is far more robust. Some have even taken their desktop SEMs on the road, providing on-site electron microscopy analysis via mobile laboratories.
Scanning electron microscopy webinars
SEM is helping researchers unlock some of the world’s greatest material and structural mysteries. Recent advancements to workflows and instruments enable scientists to expand their labs’ capabilities in a variety of application areas.
Automation is rapidly improving quality control—with fast, reproducible results. It’s saving time and money, allowing quality managers to quickly adjust their production process before costly failures and delays occur. In this on-demand webinar, we show how you can improve the quality control process with the next generation in automated desktop analysis.
Speakers: Alexander Bouman
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The Thermo Scientific Phenom ParticleX Desktop SEM (Scanning Electron Microscope) is a multi-purpose desktop SEM designed for multiple applications at the microscale: additive manufacturing, technical cleanliness, steel manufacturing QC, batteries and energy storage, and gunshot residue analysis. A versatile solution for high-quality, in-house analysis, the Phenom ParticleX Desktop SEM gives you the ability to carry out speedy characterization, verification, and classification of materials, supporting your production with fast, accurate, and trusted data. The system is simple to operate and fast to learn, opening up particle, material, and failure analysis to a wider group of users. In each webinar, our expert will focus on one particular analysis application and how the Phenom ParticleX Desktop SEM overcomes some of the most common challenges.
Speakers: Luigi Raspolini, Rogier Miltenburg
It is a good time to be in the market for a scanning electron microscope (SEM): new products and new accessories are launched every year and there are many levels of performance to choose from. But where to start? For researchers in academia or industrial R&D, it is important to match the SEM capabilities to the needs of the lab and its users. This webinar explains how different applications translate to requirements for different features and specifications on the SEM. We’ll then show how these features are represented on the line-up of full-size Thermo Scientific SEMs.
Speaker: Daniel Phifer
The Thermo Scientific Phenom Pro(X) G6 Desktop SEM is a robust, versatile, and effortless desktop scanning electron microscope designed to expand the capabilities of research facilities. Its fool-proof sample preparation and handling produce unparalleled time to data. When compared to the more common tungsten filament electron sources, its CeB6 electron source is longer lasting with higher brightness. This newest generation offers fast, high-resolution imaging, and the ProX model also features an integrated energy dispersive X-ray diffraction (EDS) detector for elemental analysis.
Speaker: Alexander Bouman
Scanning electron microscopes in forensic and crime laboratories play many roles, including gunshot residue analysis (GSR) used to determine the chemistry of particles collected from firearm suspects. These analyses frequently run for several hours and prevent other SEM uses. The ideal solution is a dedicated and cost-effective desktop SEM for GSR analysis such as the Thermo Scientific Phenom Perception GSR Desktop SEM. In this webinar, we detail the Phenom Perception GSR software workflow used in compliance with ASTM and ENFSI guidelines. The webinar covers the accuracy of the instrument and outlines the critical requirements for an effective SEM for gunshot residue analysis. We show how users can collect results from up to 30 samples in a defined recipe, scan each sample frame-by-frame, measure particle morphology at high magnification and examine each particle to classify via EDS. We also review an important step in revisiting the sample to confirm the chemistry of the GSR particle. Afterwards, the user generates a report to be presented as solid evidence. Maximum efficiency with minimal effort.
Speakers: Jeroen Smulders, Rogier Miltenburg
